Johannes Schwider

Prof. Dr. Johannes Schwider

Institut für Optik, Information und Photonik
Lehrstuhl für Experimentalphysik (Optik) (N.N., ehemals Prof. Dr. Leuchs)

Raum: Raum 01.704
Staudtstr. 7/B2
91058 Erlangen

Publikationen:

  1. Irina Harder, Martin Eisner, Reinhard Völkel, Sergej Rothau, Johannes Schwider, and Peter Schwider :
    Measuring the modulus of the spatial coherence function using an error tolerant phase shifting algorithm and a continuous lateral shearing interferometer
    Optics Express, doi: 10.1364/OE.24.005087, 24, p. 5087-5101 (2016)
  2. J. Schwider:
    Grazing incidence interferometry for rough convex aspherics
    arXiv:1612.08046v1 [physics.optics] 23 Dec 2016, , p. (2016)
  3. J. Schwider, V.Nercissian, K. Mantel:
    Phase retrieval from carrier frequency interferograms: reduction of the impact of space-variant disturbances
    J. Eur. Opt. Soc. Rapid. , 10, p.15003 (2015)
  4. J. Schwider:
    Sharp and rectified imaging of plane test objects in diffractive grazing incidence interferometers
    Appl. Opt., 53, p.988-1000 (2014)
  5. J. Schwider:
    50 years of optics research [Invited]
    Appl. Opt., 52, p.9-19 (2013)
  6. K. Mantel, J. Schwider:
    Interferometric homogeneity test using adaptive frequency comb illumination
    Appl. Opt., 52, p.1897-1912 (2013)
  7. Irina Harder,Gerd Leuchs,Klaus Mantel, and Johannes Schwider:
    Adaptive frequency comb illumination for interferometry
    APPLIED OPTICS , 50, No. 25 , p.4942-4956 ( 2011)
  8. Vanusch Nercissian, Irina Harder, Klaus Mantel, Andreas Berger, Gerd Leuchs, Norbert Lindlein, and J. Schwider:
    Diffractive simultaneous bidirectional shearing interferometry using tailored spatially coherent light
    Appl. Opt., 50, p.571-578 (2011)
  9. J. Schwider, G. Leuchs:
    Multi-pass Shack-Hartmann planeness test: monitoring thermal stress
    Optics Express, Vol. 18 Issue 8, p..8094-8106 (2010)
  10. J. Schwider:
    Multiple beam Fizeau interferometer with frequency comb illumination
    Opt. Comm., 282, p.3308-3324 (2009)
  11. Gerd Leuchs, Klaus Mantel, Andreas Berger, Hildegard Konermann, Markus Sondermann, Ulf Peschel, Norbert Lindlein, and Johannes Schwider :
    Interferometric null test of a deep parabolic reflector generating a Hertzian dipole field
    Applied Optics, 47, p.5570-5584 (2008)
  12. R. Schreiner, J. Schwider, N. Lindlein, and K. Mantel :
    Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions
    Applied Optics, 47, p.6134-6141 (2008)
  13. J. Schwider:
    Fizeau-type Multi-Pass Shack-Hartmann-Test
    Opt. Expr., 16,Issue 1, p.362-372 (2008)
  14. G. Leuchs, N. Lindlein,K. Mantel; M. Sondermann, H. Konermann, J. Schwider:
    Interferometric null test of a parabolic reflectorgenerating a Hertzian dipole field
    Proc. SPIE, 7063, p. (2008)
  15. J. Schwider:
    Coarse frequency comb interferometry
    Proc. SPIE, 7063, p.04.1-04.15 (2008)
  16. G.S. Khan, K. Mantel, I. Harder, N. Lindlein, J. Schwider:
    Design considerations for the absolute testing approach of aspherics using combined diffractive optical elements.
    Appl. Opt., 46(28), p.7040-7048 (2007)
  17. J. Schwider, I. Harder:
    A diffractive Polarization-Fizeau-interferometer
    EOS Topical Meeting on Diffractive Optics Barcelona, Poster, p. (2007)
  18. J. Schwider, N. Lindlein, K. Mantel, I. Harder:
    On the calibration of diffractive nulls for transmission test of aspheric components
    Opt. Comm., 279, p.262-272 (2007)
  19. J. Schwider:
    Superposition fringes for profiling applications
    Proc. SPIE, 6616, p.paper59 (2007)
  20. K. Mantel, J. Lamprecht, N. Lindlein, J. Schwider:
    Absolute calibration in grazing incidence interferometry via rotational averaging.
    Appl. Opt., 45(16), p.3740-3745 (2006)
  21. K. Mantel, J. Lamprecht, N. Lindlein, J. Schwider:
    Calibration for cylindrical specimens in grazing-incidence interferometry via integration of difference measurements.
    Appl. Opt., 45(31), p.8013-8018- (2006)
  22. F. Simon, G. Khan, K. Mantel, N. Lindlein, J .Schwider:
    Quasi-absolute measurement of aspheres with a combined diffractive optical element as reference.
    Appl. Opt., 45(22), p.8606-8612 (2006)
  23. J. Lamprecht, N. Lindlein, J. Schwider:
    Characterization of cylindrical micro-lenses in transmitted light and with grazing incidence interferometry in reflected light
    Proc. SPIE, 6188, p.Art.No.618816 (2006)
  24. J. Schwider:
    Fringe localization in the Twyman-Green Interferometer using extended monochromatic sources”
    Proc. SPIE , 6392, p. 0G1-0G12 (2006)
  25. K. Mantel, N. Lindlein, J. Schwider:
    Simultaneous characterization of the quality and orientation of cylindrical lens surfaces.
    Appl. Opt., 44(15), p.2970-2977 (2005)
  26. K. Mantel, N. Lindlein, J. Schwider:
    Simultaneous characterization of the quality and orientation of cylindrical lens surfaces
    Appl. Opt.-OT , 44, p.2970-2977 (2005)
  27. J. Schwider:
    MOEMS, Micro-Optico-Electro-Mechanical Systems, ed. M. Motamedi
    Monography, chapt. Micro-optical Testing, SPIE Press, p.222 (2005)
  28. J. Schwider, G. Fütterer, N. Lindlein:
    Diffractive lateral shearing interferometer for phase shift mask measurement using an excimer laser source
    Proc. 8-th International Symposium on Laser Metrology Merida Mexico, SPIE, Volume 5776, , p.270-277 (2005)
  29. N. Lindlein, J. Lamprecht, J. Schwider:
    Interferometric measurement of microlenses including cylindrical lenses.
    In Microoptics, ed. J. Jahns, K.-H. Brenner, Springer, New York, , p. (2004)
  30. J. Schneider, K. Mantel, R. Schreiner, N. Lindlein, J. Schwider:
    Compensation of the Anamorphic Distortion in Grazing Incidence Interferometry.
    Appl. Opt., 42(22), p.4480 (2003)
  31. Pfortner, A.; Schwider, J. :
    Red-green-blue interferometer for the metrology of discontinuous structures
    Appl. Opt. (USA) , 42 , p.667-673 (2003 )
  32. Schreiner, R.; Beyerlein, M.; Harder, I.; Dresel, T.; Lindlein, N.; Schwider, J. :
    Form assessment of hollow cylindrical specimens
    Appl. Opt. (USA) , 41 , p.64 (2002 )
  33. Beyerlein, M.; Lindlein, N.; Schwider, J. :
    Dual-wave-front computer-generated holograms for quasi-absolute testing of aspherics
    Appl. Opt. (USA) , 41 , p.2440 (2002 )
  34. Ottevaere, H.; Volckaerts, B.; Lamprecht, J.; Schwider, J.; Hermanne, A.; Veretennicoff, I.; Thienpont, H. :
    Two-dimensional plastic microlens arrays by deep lithography with protons: Fabrication and characterization
    J. Opt. A, Pure Appl. Opt. (UK) , 4 , p.S22 (2002 )
  35. Schwider, J.; Lindlein, N.; Schreiner, R.; Lamprecht, J. :
    Grazing-incidence test for cylindrical microlenses with high numerical aperture
    J. Opt. A, Pure Appl. Opt. (UK) , 4 , p.S10 (2002 )
  36. Schwider, J.; Lamprecht, J. :
    Interferometric testing of refractive microcylinder lenses
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4778 , p.177 (2002 )
  37. Pfortner, A.; Schwider, J. :
    3 lambda -metrology
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4777 , p.194-201 (2002 )
  38. Fuetterer, G.; Lano, M.; Lindlein, N.; Schwider, J. :
    Lateral shearing interferometer for phase-shift mask measurement at 193 nm
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4691 , p.541 (2002 )
  39. Fuetterer, G.; Herbst, W.; Rottstegge, J.; Ferstl, M.; Sebald, M.; Schwider, J. :
    Interference patterning of gratings with a period of 150 nm at a wavelength of 157 nm
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4691 , p.1703 (2002 )
  40. Rottstegge, J.; Herbst, W.; Hien, S.; Fuetterer, G.; Eschbaumer, C.; Hohle, C.; Schwider, J.; Sebald, M. :
    Ultrathin film imaging at 157 nm
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4690 , p.233 (2002 )
  41. Schwider, J.; Lindlein, N.; Schreiner, R.; Lamprecht, J.; Leuchs, G.; Pfund, J.; Beyerlein, M. :
    Optical testing of refractive microlenses
    Tech. Mess. tm (Germany) , 69 , p.467 (2002 )
  42. Pfund, J.; Lindlein, N.; Schwider, J. :
    Nonnull testing of rotationally symmetric aspheres: a systematic error assessment
    Appl. Opt. (USA) , 40 , p.439 (2001 )
  43. Pfortner, A.; Schwider, J. :
    Dispersion error in white-light Linnik interferometers and its implications for evaluation procedures
    Appl. Opt. (USA) , 40 , p.6223-6228 (2001 )
  44. Schwider, J.; Dresel, T.; Beyeriein, M.; Horder, I.; Lindlein, N.; Collischon, M.; Leuchs, G. :
    Diffractive optical elements for light manipulation
    LaserOpto (Germany) , 33 , p.41 (2001 )
  45. Lindlein, N.; Pfund, J.; Schwider, J. :
    Algorithm for expanding the dynamic range of a Shack-Hartmann sensor by using a spatial light modulator array
    Opt. Eng., Bellingham (USA) , 40 , p.837 (2001 )
  46. Kipfer, P.; Collischon, M.; Haidner, H.; Schafer, H.; Schwider, J. :
    A novel design for beam forming grating couplers
    Optik (Germany) , 112 , p.76 (2001 )
  47. Dresel, T.; Lindlein, N.; Schwider, J. :
    Empirical strategy for detection and removal of misalignment aberrations in interferometry
    Optik (Germany) , 112 , p.304 (2001 )
  48. Lindlein, N.; Schwider, J. :
    Optical measurement methods for refractive microlenses and arrays
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4455 , p.264 (2001 )
  49. Ottevaere, H.; Tuteleers, P.; Volchaerts, B.; Baukens, V.; Lamprecht, J.; Schwider, J.; Hermanne, A.; Naessens, K.; Veretennicoff, I.; Thienpont, H. :
    Microlens arrays fabricated by deep lithography with protons and their characterization
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4455 , p.272 (2001 )
  50. Lindlein, N.; Lamprecht, J.; Mantel, K.; Schwider, J. :
    Interferometrical measurement of cylindrical lenses with the help of computer generated holograms
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4440 , p.127 (2001 )
  51. Groening, S.; Sick, B.; Donner, K.; Pfund, J.; Lindlein, N.; Schwider, J. :
    Wave-front reconstruction with a Shack-Hartmann sensor with an iterative spline fitting method
    Appl. Opt. (USA) , 39 , p.561 (2000 )
  52. Pfund, J.; Schwider, J. :
    Laser beam characterization by using a Shack-Hartmann sensor
    Conference Digest. 2000 Conference on Lasers and Electro-Optics Europe (Cat. No.00TH8505) , , p. (2000 )
  53. Breitkopf, P.; Collischon, M.; Schmidt, J.; Schwider, J. :
    Holographically recorded axicon for grazing incidence interferometry
    J. Mod. Opt. (UK) , 47 , p.701 (2000 )
  54. Hettwer, A.; Kranz, J.; Schwider, J. :
    Three channel phase-shifting interferometer using polarization-optics and a diffraction grating
    Opt. Eng., Bellingham (USA) , 39 , p.960 (2000 )
  55. Lindlein, N.; Pfund, J.; Schwider, J. :
    Expansion of the dynamic range of a Shack-Hartmann sensor by using astigmatic microlenses
    Opt. Eng., Bellingham (USA) , 39 , p.2220 (2000 )
  56. Nurge, H.; Schwider, J. :
    Measurement of curvature and thickness variations of plane surfaces by grazing incidence interferometry
    Optik (Germany) , 111 , p.319 -327 (2000 )
  57. Schreiner, R.; Lindlein, N.; Dresel, T.; Schwider, J.; Brinkmann, S.; Mischo, H. :
    Testing acylindrical microlenses at grazing incidence
    Optik (Germany) , 111 , p.397 -406 (2000 )
  58. Nurge, H.; Schwider, J. :
    Testing of cylindrical lenses by grazing incidence interferometry
    Optik (Germany) , 111 , p.545 -555 (2000 )
  59. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Grazing incidence interferometry using diffractive optical elements for the shape measurement of the mantle surface of rod-shaped objects. I. Measuring principle and theory
    Tech. Mess. tm (Germany) , 67 , p.10 -19 (2000 )
  60. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Grazing incidence interferometry using diffractive optical elements for the shape measurement of the mantle surface of rod-shaped objects. II. Experiments and error assessment
    Tech. Mess. tm (Germany) , 67 , p.81-91 (2000 )
  61. Beyerlein, M.; Schwider, J. :
    Comparing beam-shaping CGHs for coherent and partially coherent light
    Trends in Optics and Photonics. Diffractive Optics and Micro-Optics. Vol.41. Technical Digest. Postconference Edition , , p.29 (2000 )
  62. Pfund, J.; Lindlein, N.; Schwider, J. :
    Non-null testing of aspherical surfaces by using a Shack-Hartmann sensor
    Trends in Optics and Photonics. Optical Fabrication and Testing. Vol.42. Technical Digest. Postconference Edition , , p.112 (2000 )
  63. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Testing of rod objects by grazing-incidence interferometry: experiment
    Appl. Opt. (USA) , 38 , p.121 -125 (1999 )
  64. Schwider, J.; Dresel, T.; Manzke, B. :
    Some considerations of reduction of reference phase error in phase-stepping interferometry
    Appl. Opt. (USA) , 38 , p.655 (1999 )
  65. Emer, W.; Schwider, J. :
    Ultraviolet interferometry with apochromatic reflection optics
    Appl. Opt. (USA) , 38 , p.3516 (1999 )
  66. S. Brinkmann, Th. Dresel, R. Schreiner, J. Schwider:
    *Das Diffraxicon-Interferometer zur Prüfung von Zylinderflächen*
    Laser, 3, p.28-31 (1999)
  67. J. Schwider:
    Interferometric tests for aspherics”, in
    OSA TOPS Vol. 24 Fabrication and Testing of Aspheres; eds. J. S. Taylor, M. Piscotty, and A. Lindquist, 24, p.103-114 (1999)
  68. Sickinger, H.; Schwider, J.; Manzke, B. :
    Fiber based Mach-Zehnder interferometer for measuring wave aberrations of microlenses
    Optik (Germany) , 110 , p.239 (1999 )
  69. Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
    Interferometric testing of technical surfaces by grazing incidence interferometry in the infrared region
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3823 , p.115 -122 (1999 )
  70. Kranz, J.; Hettwer, A.; Lamprecht, J.; Schwider, J. :
    Error analysis for a single-frame phase-shifting speckle interferometer
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.178 (1999 )
  71. Pfund, J.; Lindlein, N.; Schwider, J. :
    Aspherical surface testing by using spherical compensation
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.254 (1999 )
  72. Schwider, J.; Brinkmann, S.; Schreiner, R.; Dresel, T. :
    Grazing incidence interferometry with the help of diffractive masters
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.290 (1999 )
  73. Nurge, H.; Schwider, J. :
    Testing of cylindrical lenses by grazing incidence interferometry
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.609 (1999 )
  74. Sharma, D.K.; Schwider, J. :
    Twyman Green interferometer with CGH for testing of cylindrical surfaces
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3729 , p.399 (1999 )
  75. Wachter, C.; Schreiber, P.; Karthe, W.; Elbers, J.-P.; Glingener, C.; Voges, E.; Krabe, R.; Dumcke, R.; Reichl, H.; Hagner, G.; Schroter, S.; Bartelt, H.; Stock, E.A.; Bauer, G.; Schafer, W.; Sickinger, H.; Schwider, J. :
    Design and modelling of optical microsystems-an approach to a user-friendly system integration technique
    1998 International Conference on Modeling and Simulation of Microsystems, Semiconductors, Sensors and Actuators , , p.631 (1998 )
  76. Pfund, J.; Lindlein, N.; Schwider, J. :
    Misalignment effects of the Shack-Hartmann sensor
    Appl. Opt. (USA) , 37 , p.22 (1998 )
  77. Hocke, R.; Brand, H.; Collischon, M.; Schwider, J. :
    Line-selective CO/sub 2/ lasers with apodized Littrow-gratings
    ITG-Fachber. (Germany) , , p.393 (1998 )
  78. Dresel, T.; Brinkmann, S.; Schreiner, R.; Schwider, T. :
    Testing of rod objects by grazing incidence interferometry: theory
    J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 15 , p.2921 -2928 (1998 )
  79. Lindlein, N.; Simon, F.; Schwider, J. :
    Simulation of micro-optical array systems with RAYTRACE
    Opt. Eng., Bellingham (USA) , 37 , p.1809 (1998 )
  80. Brinkmann, S.; Schreiner, R.; Dresel, T.; Schwider, J. :
    Interferometric testing of plane and cylindrical workpieces with computer-generated holograms
    Opt. Eng., Bellingham (USA) , 37 , p.2506 -2511 (1998 )
  81. Pfund, J.; Lindlein, N.; Schwider, J.; Burow, R.; Blumel, Th.; Elssner, K.-E. :
    Absolute sphericity measurement: a comparative study of the use of interferometry and a Shack-Hartmann sensor
    Opt. Lett. (USA) , 23 , p.742 (1998 )
  82. Eisner, M.; Lindlein, N.; Schwider, J. :
    Confocal microscopy with a refractive microlens-pinhole array
    Opt. Lett. (USA) , 23 , p.748 (1998 )
  83. Pfund, J.; Lindlein, N.; Schwider, J. :
    Dynamic range expansion of a Shack-Hartmann sensor by use of a modified unwrapping algorithm
    Opt. Lett. (USA) , 23 , p.995 (1998 )
  84. Schwider, J. :
    DOE-based interferometry
    Optik (Germany) , 108 , p.181 (1998 )
  85. Emer, W.; Schwider, J. :
    Interferometry with VUV wavelengths
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3478 , p.202 (1998 )
  86. Lindlein, N.; Schwider, J. :
    Measurement devices with and for micro-optics at the University of Erlangen
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3407 , p.47 (1998 )
  87. Kranz, J.; Lamprecht, J.; Hettwer, A.; Schwider, J. :
    Fiber optical single frame speckle interferometer for measuring industrial surfaces
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3407 , p.328 (1998 )
  88. Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
    Optical testing of cylindrical surfaces by grazing incidence interferometry in the infrared region
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3407 , p.443 (1998 )
  89. Schwider, J. :
    White-light Fizeau interferometer
    Appl. Opt. (USA) , 36 , p.1433 (1997 )
  90. Lindlein, N.; Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
    Axicon-type test interferometer for cylindrical surfaces: systematic error assessment
    Appl. Opt. (USA) , 36 , p.2791-2795 (1997 )
  91. Schreiber, H.; Schwider, J. :
    Lateral shearing interferometer based on two Ronchi phase gratings in series
    Appl. Opt. (USA) , 36 , p.5321 (1997 )
  92. Gundlach, A.; Huntley, J.M.; Manzke, B.; Schwider, J. :
    Speckle shearing interferometry using a diffractive optical beamsplitter
    Opt. Eng., Bellingham (USA) , 36 , p.1488 (1997 )
  93. Schwider, J.; Sickinger, H. :
    Array tests for microlenses
    Optik (Germany) , 107 , p.26 (1997 )
  94. Brinkmann, S.; Schreiner, R.; Dresel, T.; Schwider, J. :
    Interferometric testing of technical surfaces with computer generated holograms
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3098 , p.83 (1997 )
  95. Dresel, T.; Beyerlein, M.; Schwider, J. :
    Design and fabrication of computer-generated beam-shaping holograms
    Appl. Opt. (USA) , 35 , p.4615 (1996 )
  96. Dresel, T.; Beyerlein, M.; Schwider, J. :
    Design of computer generated beam-shaping holograms by iterative finite-element mesh adaption
    Appl. Opt. (USA) , 35 , p.6865 (1996 )
  97. Dresel, T.; Schwider, J. :
    Fabrication of optical components by laser lithography
    Appl. Surf. Sci. (Netherlands) , 106 , p.379 (1996 )
  98. Kipfer, P.; Collischon, M.; Haidner, H.; Schwider, J. :
    Subwavelength structures and their use in diffractive optics
    Opt. Eng., Bellingham (USA) , 35 , p.726 (1996 )
  99. Schwider, J. :
    Achromatic design of holographic optical interconnects
    Opt. Eng., Bellingham (USA) , 35 , p.826 (1996 )
  100. Falkenstorfer, O.; Lindlein, N.; Keinonen, T.; Schwider, J. :
    Diffraction-limited holographic lenses in dichromated gelatine
    Opt. Eng., Bellingham (USA) , 35 , p.2026 (1996 )
  101. Eisner, M.; Schwider, J. :
    Transferring resist microlenses into silicon by reactive ion etching
    Opt. Eng., Bellingham (USA) , 35 , p.2979 (1996 )
  102. Heissmeier, M.; Sheridan, J.T.; Schwider, J. :
    Calibration of a microlithographic fabrication process using non-destructive testing and rigorous electromagnetic theory
    Optik (Germany) , 103 , p.12 (1996 )
  103. Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
    Axicon-type test interferometer for cylindrical surfaces
    Optik (Germany) , 102 , p.106-110 (1996 )
  104. Du, C.; Zuerl, K.; Schwider, J. :
    Wavefront characterization with a miniaturized Shack-Hartmann sensor
    Optik (Germany) , 101 , p.151 (1996 )
  105. Schwider, J.; Schreiber, H.; Zhou, L. :
    Physical limitations and challenges in modern interferometry
    Optik (Germany) , 101 , p.166 (1996 )
  106. J. Schwider, O. Falkenstörfer:
    Twyman-Green interferometer for testing microspheres”,
    Opt. Eng. , 34, p.2972-2975 (1995)
  107. Kobolla, H.; Schmidt, J.; Gluch, E.; Schwider, J. :
    Holographic perfect shuffle permutation element for a miniaturized switching network
    Appl. Opt. (USA) , 34 , p.2844 (1995 )
  108. Volkel, R.; Junger, S.; Rosner, S.; Schwider, J.; Gruhler, U.; Schreck, H.; Burghardt, H.; Wiedeburg, K. :
    Optical backplane for a broadband switching system
    Electron. Lett. (UK) , 31 , p.234 (1995 )
  109. Collischon, M.; Haidner, H.; Kipfer, P.; Schwab, M.; Schwider, J. :
    Optimized artificial index gratings
    Infrared Phys. Technol. (UK) , 36 , p.915 (1995 )
  110. Korner, T.O.; Sheridan, J.T.; Schwider, J. :
    Interferometric resolution examined by means of electromagnetic theory
    J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 12 , p.752 (1995 )
  111. Schwab, M.; Lindlein, N.; Schwider, J.; Amitai, Y.; Friesem, A.A.; Reinhorn, S. :
    Compensation of the wavelength dependence in diffractive star couplers
    J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 12 , p.1290 (1995 )
  112. Schwider, J.; Falkenstorfer, O. :
    Twyman-Green interferometer for testing microspheres
    Opt. Eng., Bellingham (USA) , 34 , p.2972 -2975 (1995 )
  113. Dresel, T.; Schwider, J.; Wehrhahn, A.; Babin, S. :
    Grazing incidence interferometry applied to the measurement of cylindrical surfaces
    Opt. Eng., Bellingham (USA) , 34 , p.3531-3535 (1995 )
  114. Zurl, K.; Gluch, E.; Schafer, B.; Schwider, J.; Fey, D.; Erhard, W. :
    Smart pixels with VCSELs: potential and demonstration system
    Optical Computing. Proceedings of the International Conference , , p.507 (1995 )
  115. Koerner, T.O.; Sheridan, J.T.; Schwider, J. :
    Classical diffraction by deep rectangular gratings using the Legendre exact eigenfunction method
    Optik (Germany) , 99 , p.95 (1995 )
  116. Kranz, J.; Mejri, J.; Zurl, K.; Schwider, J. :
    A monolithic optoelectronic high-speed receiver circuit
    Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2A , , p.226 (1995 )
  117. Eisner, M.; Falkenstorfer, O.; Haselbeck, S.; Schwider, J. :
    Etched microlenses in silicon
    Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2A , , p.377 (1995 )
  118. Dresel, Th.; Beyerlein, M.; Schwider, J. :
    Computer generated beam shaping holograms
    Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2B , , p.584 (1995 )
  119. Schwider, J. :
    Achromatic design of holographic optical interconnects
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2537 , p.148 (1995 )
  120. Schwider, J.; Zhou, L. :
    Dispersive interferometric profilometer
    Proceedings of the International Seminar on Quantitative Microscopy. 125th PTB-Seminar (PTB-Bericht F-21) , , p.1 (1995 )
  121. Collischon, M.; Haidner, I.; Kipfer, P.; Lang, A.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J. :
    Binary blazed reflection gratings
    Appl. Opt. (USA) , 33 , p.3572 (1994 )
  122. Hutfless, J.; Rebhan, T.; Lutz, N.; Geiger, M.; Frank, M.; Streibl, N.; Schwider, J. :
    Micro optics for efficient material processing with excimer lasers
    Laser Optoelektron. (Germany) , 26 , p.50 (1994 )
  123. Kipfer, P.; Collischon, M.; Haidner, H.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J. :
    Infrared optical components based on a microrelief structure
    Opt. Eng., Bellingham (USA) , 33 , p.79 (1994 )
  124. Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Schwider, J. :
    Characterization of microlenses using a phase-shifting shearing interferometer
    Opt. Eng., Bellingham (USA) , 33 , p.2680 (1994 )
  125. Schwider, T.; Streibl, N.; Schmidt, J.; Zurl, K.; Volkel, R. :
    Synchronous optical clock distribution for optoelectronic interconnections
    Opt. Lett. (USA) , 19 , p.75 (1994 )
  126. Schwider, J. :
    Detection of undersampling from measured phase-shifting data
    Opt. Lett. (USA) , 19 , p.231 (1994 )
  127. Schwider, J.; Liang Zhou :
    Dispersive interferometric profilometer
    Opt. Lett. (USA) , 19 , p.995 (1994 )
  128. Sheridan, J.T.; Schwider, J.; Streibl, N.; Haselbeck, S.; Eisner, M.; Heissmeier, H.; Falkenstorfer, O. :
    Modelling and measurement of melted microlens shapes
    Optik (Germany) , 97 , p.174 (1994 )
  129. Heissmeier, M.; Sheridan, J.T.; Schwider, J.; Streibl, N. :
    Detection of errors in microlithographic grating fabrication using a simple methodology
    Optik (Germany) , 95 , p.161 (1994 )
  130. Kipfer, P.; Collischon, M.; Haidner, H.; Schwider, J. :
    Diffractive surface relief elements for the use in the infrared: waveguide structures as reflection holograms
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2169 , p.100 (1994 )
  131. Haselbeck, S.; Eisner, M.; Schreiber, H.; Schwider, J. :
    Reactive ion etching of microlens arrays into fused silica
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2169 , p.142 (1994 )
  132. Falkenstorfer, O.; Keinonen, T.; Lindlein, N.; Schwider, J.; Streibl, N. :
    Iterative correction of holographic lenses
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2169 , p.200 (1994 )
  133. Schwab, M.; Lindlein, N.; Schwider, J.; Amitai, Y.; Friesem, A.A.; Reinhorn, S. :
    Achromatic diffractive fan-out systems
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2152 , p.173 (1994 )
  134. Volkel, R.; Junger, S.; Kobolla, H.; Schmidt, J.; Schwider, J.; Streibl, N. :
    Optoelectronic interconnects with high packing densities
    Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.10 (1993 )
  135. Schwider, J.; Haselbeck, S.; Schreiber, H.; Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Keinonen, T.; Sheridan, S.; Streibl, N. :
    Production and control of refractive and diffractive microlenses
    Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.47 (1993 )
  136. Collischon, M.; Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J. :
    Design of artificial dielectric diffractive elements
    Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.204 (1993 )
  137. Collischon, M.; Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J. :
    Diffractive optical elements for high power CO/sub 2/ laser applications
    Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.243 (1993 )
  138. Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Collischon, M.; Hutfless, J.; Marz, M. :
    Diffraction grating with rectangular grooves exceeding 80% diffraction efficiency
    Infrared Phys. (UK) , 34 , p.467 (1993 )
  139. Kobolla, H.; Sheridan, J.T.; Gluch, E.; Schmidt, J.; Volkel, R.; Schwider, J.; Streibl, N. :
    Holographic 2D mixed polarization deflection elements
    J. Mod. Opt. (UK) , 40 , p.613 (1993 )
  140. Lindlein, N.; Schwider, J.; Schrader, M.; Falkenstorfer, O.; Volkel, R.; Streibl, N. :
    Wavelength mismatch correcting elements for volume holograms written on a laser pattern generator
    J. Mod. Opt. (UK) , 40 , p.647 (1993 )
  141. Falkenstorfer, O.; Schwider, J.; Lindlein, N.; Bohm, A.; Schreiber, H.; Otto, A.; Volkel, R.; Zoller, A. :
    Interferometric measurement of holographic lenslets
    J. Mod. Opt. (UK) , 40 , p.733 (1993 )
  142. Volkel, R.; Rosner, S.; Kobolla, H.; Schmidt, J.; Schwider, J.; Sheridan, J.T.; Streibl, N. :
    Measurements of the angular spectrum of stray-light for holographic optical elements in dichromated gelatin
    J. Mod. Opt. (UK) , 40 , p.1787 (1993 )
  143. Gluch, E.; Kobolla, H.; Zurl, K.; Streibl, N.; Schwider, J. :
    Demonstration for an optoelectronic switching network
    J. Mod. Opt. (UK) , 40 , p.1857 (1993 )
  144. Lindlein, N.; Schwider, J. :
    Local wave fronts at diffractive elements
    J. Opt. Soc. Am. A, Opt. Image Sci. (USA) , 10 , p.2563 (1993 )
  145. Streibl, N.; Volkel, R.; Schwider, J.; Habel, P.; Lindlein, N. :
    Parallel optoelectronic interconnections with high packing density through a light-guiding plate using grating couplers and field lenses
    Opt. Commun. (Netherlands) , 99 , p.167 (1993 )
  146. Haidner, H.; Sheridan, J.T.; Schwider, J.; Streibl, N. :
    Design of a blazed grating consisting of metallic subwavelength binary grooves
    Opt. Commun. (Netherlands) , 98 , p.5 (1993 )
  147. Krackhardt, U.; Schwider, J.; Schrader, M.; Streibl, N. :
    Synthetic holograms written by a laser pattern generator
    Opt. Eng., Bellingham (USA) , 32 , p.781 (1993 )
  148. Haselbeck, S.; Schreiber, H.; Schwider, J.; Streibl, N. :
    Microlenses fabricated by melting a photoresist on a base layer
    Opt. Eng., Bellingham (USA) , 32 , p.1322 (1993 )
  149. Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J.; Collischon, M.; Lang, A.; Hutfless, J. :
    Polarizing reflection grating beamsplitter for the 10.6- mu m wavelength
    Opt. Eng., Bellingham (USA) , 32 , p.1860 (1993 )
  150. Schwider, J.; Falkenstorfer, O.; Schreiber, H.; Zoller, A.; Streibl, N. :
    New compensating four-phase algorithm for phase-shift interferometry
    Opt. Eng., Bellingham (USA) , 32 , p.1883 -1885 (1993 )
  151. Schwider, J.; Streibl, N.; Zurl, K. :
    Optoelectronic interconnections
    Parallel Computer Architectures Theory, Hardware, Software, Applications , , p.1 (1993 )
  152. Schwider, J.; Haselbeck, S.; Schreiber, H.; Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Zoller, A.; Haidner, H.; Kipfer, P.; Heissmeier, M.; Keinonen, T.; Sheridan, J.T.; Brinkmann, S.; Streibl, N. :
    Production and control of refractive and diffractive microlenses
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1992 , p.102 (1993 )
  153. Volkel, R.; Heibmeier, M.; Kobolla, H.; Krackhardt, U.; Rosner, S.; Schmidt, J.; Schwider, J.; Sheridan, J.T.; Streibl, N.; Zobel, F. :
    Optoelectronic interconnects with holographic optical elements
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1849 , p.104 (1993 )
  154. Schmidt, J.; Volkel, R.; Rosner, S.; Stork, W.; Sheridan, J.T.; Durst, F.; Schwider, J.; Streibl, N. :
    Holographic optical coupling and beamsplitting elements for optoelectronic interconnects and sensors
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1751 , p.268 (1993 )
  155. Streibl, N.; Heissmeier, M.; Hofmann, W.; Krackhardt, U.; Schrader, M.; Schwider, J.; Sperl, M. :
    Laser beam writing of computer generated diffractive optical components
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.67 (1993 )
  156. Falkenstorfer, O.; Schwider, J.; Bohm, A.; Schreiber, H. :
    Measurement of the wave aberrations of holographic optical lens elements
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.112 (1993 )
  157. Schmidt, J.; Volkel, R.; Schwider, J.; Sheridan, J.T.; Stork, W.; Streibl, N.; Stieglmeier, M.; Durst, F. :
    Holographic optical elements for interconnects and sensors
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.271 (1993 )
  158. Kobolla, H.; Sheridan, J.T.; Gluch, E.; Schwider, J.; Streibl, N. :
    Mixed polarization 2-D holographic permutation elements
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.278 (1993 )
  159. Lindlein, N.; Schwider, J.; Habel, P.; Schrader, M. :
    Computer generated holograms for the correction of the aberrations of thick holographic optical lens elements
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1718 , p.13 (1993 )
  160. Falkenstorfer, O.; Schwider, J.; Bohm, A.; Schreiber, H. :
    Measurement of the wave aberrations of holographic optical lens elements
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1718 , p.22 (1993 )
  161. Haselbeck, S.; Heissmeier, M.; Hofmann, W.; Krackhardt, U.; Manzke, B.; Savander, P.; Schrader, M.; Schwider, J.; Sperl, M.; Streibl, N. :
    Synthetic phase holograms written by laser lithography
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1718 , p.117 (1993 )
  162. Schwider, J. :
    Measuring phase dispersion of dielectric multilayer stacks
    Appl. Opt. (USA) , 31 , p.6107 (1992 )
  163. Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
    Possibilities and limitations of space-variant holographic optical elements for switching networks and general interconnects
    Appl. Opt. (USA) , 31 , p.7403 (1992 )
  164. Schmidt, J.; Volkel, R.; Stork, W.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Durst, F. :
    Diffractive beam splitter for laser Doppler velocimetry
    Opt. Lett. (USA) , 17 , p.1240 (1992 )
  165. Schwider, J. :
    Fizeau- and Michelson-type interferograms and their relation to the absolute testing of optical surfaces
    Optik (Germany) , 89 , p.113 (1992 )
  166. Lindlein, N.; Schwider, J. :
    Practical notes on designing and analysing thick holographic optical elements
    Pure Appl. Opt. (UK) , 1 , p.111 (1992 )
  167. Dresel, T.; Horstmann, A.; Otto, A.; Schwider, J. :
    UV interferometry for microstructure measurements
    Pure Appl. Opt. (UK) , 1 , p.241 (1992 )
  168. J. Schwider:
    Characterisation of interconnection components
    Lalanne, P. Chavel, Perspectives for parallel optical interconnects, Springer, p.109-148 (1991)
  169. Haumann, H.J.; Kobolla, H.; Sauer, F.; Schmidt, J.; Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
    Optoelectronic interconnection based on a light-guiding plate with holographic coupling elements
    Opt. Eng., Bellingham (USA) , 30 , p.1620 (1991 )
  170. Kobolla, H.; Lindlein, N.; Falkenstorfer, O.; Rosner, S.; Schmidt, J.; Schwider, J.; Streibl, N.; Volkel, R. :
    Optoelectronic interconnects with holographic optical elements
    Third International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.342) , , p.123 (1991 )
  171. Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
    Possibilities and limitations of space-variant holographic optical elements for switching networks and general interconnects
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1319 , p.130 (1990 )
  172. Haumann, H.-J.; Kobolla, H.; Sauer, F.; Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
    Holographic coupling elements for optical bus systems based on a light-guiding optical backplane
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1319 , p.588 (1990 )
  173. J. Schwider:
    Advanced evaluation techniques in interferometry
    Prog. in Optics XXVIII, E. Wolf, Ed., Elsivier Publisher New York , 28, p.271-359 (1990)
  174. Schwider, J. :
    Phase shifting interferometry: reference phase error reduction
    Appl. Opt. (USA) , 28 , p.3889 (1989 )
  175. Lohmann, A.W.; Lukosz, W.; Schwider, J.; Streibl, N.; Thomas, J.A. :
    Array illuminators for the optical computer
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 963 , p.232 (1989 )
  176. Lohmann, A.W.; Schwider, J.; Streibl, N.; Thomas, J. :
    Array illuminator based on phase contrast
    Appl. Opt. (USA) , 27 , p.2915 (1988 )
  177. Kinnstaetter, K.; Lohmann, A.W.; Schwider, J.; Streibl, N. :
    Accuracy of phase shifting interferometry
    Appl. Opt. (USA) , 27 , p.5082 -5089 (1988 )
  178. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
    Semiconductor wafer and technical flat planeness testing interferometer
    Measurement (UK) , 5 , p.98 (1987 )
  179. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
    Semiconductor wafer and technical flat planeness testing interferometer
    Appl. Opt. (USA) , 25 , p.1117 (1986 )
  180. Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. : :
    Semiconductor wafer and technical flat planeness testing interferometer
    Proceedings of 1st Symposium of the technical committee TC14 IMEKO , Working Group on Laser Measurement, Budapest 11.19-21, 1986, Nova Science Publishers, Commmack, New York,11725, , p.85-92 (1986)
  181. Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. : :
    Results and error sources in absolute sphericity measurement
    Proceedings of 1st Symposium of the technical committee TC14 IMEKO , Working Group on Laser Measurement, Budapest 11.19-21, 1986, Nova Science Publishers, Commmack, New York,11725, , p.93-103 (1986)
  182. Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. : :
    Automatic frozen fringe analysis
    Proceedings of 1st Symposium of the technical committee TC14 IMEKO , Working Group on Laser Measurement, Budapest 11.19-21, 1986, Nova Science Publishers, Commmack, New York,11725, , p.227-235 (1986)
  183. Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. :
    Homogeneity testing by phase sampling interferometry
    Appl. Opt. (USA) , 24 , p.3059 (1985 )
  184. Schwider, J. :
    Continuous lateral shearing interferometer
    Appl. Opt. (USA) , 23 , p.4403 (1984 )
  185. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
    High accuracy phase measurement in real time
    Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 473 , p.156 (1984 )
  186. Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R.; Merkel, K. :
    Digital wave-front measuring interferometry: some systematic error sources
    Appl. Opt. (USA) , 22 , p.3421-3432 (1983 )
  187. Schwider, J. :
    Single sideband Ronchi test
    Appl. Opt. (USA) , 20 , p.2635 (1981 )
  188. Schwider, J. :
    Superposition fringe shear interferometer
    Appl. Opt. (USA) , 19 , p.4233 (1980 )
  189. Schwider, J.; Grzanna, J.; Spolaczyk, R.; Burow, R. :
    Testing aspherics in reflected light using blazed synthetic holograms
    Opt. Acta (UK) , 27 , p.683 (1980 )
  190. Schwider, J. :
    Superposition fringes as a measuring tool in optical testing
    Appl. Opt. (USA) , 18 , p.2364 -2367 (1979 )
  191. Schwider, J.; Burow, R. :
    Wave aberrations caused by misalignments of aspherics, and their elimination
    Opt. Appl. (Poland) , 9 , p.33 (1979 )
  192. Schwider, J.; Burow, R.; Grzanna, J. :
    CGH-testing of rotational-symmetric aspheric in compensated interferometers
    Opt. Appl. (Poland) , 9 , p.39 (1979 )
  193. Schwider, J.; Hiller, Ch. :
    The alignment of flat structures by means of Moire technique
    Opt. Acta (UK) , 23 , p.49 (1976 )
  194. Schwider, J. :
    Interferometric measurement of the amplitude point spread function and the wavefront variation
    Opt. Acta (UK) , 23 , p.115 -127 (1976 )
  195. Schulz, G.; Schwider, J. :
    Interferometric testing of smooth surfaces
    Progress in optics, vol.XIII , , p.93 (1976 )
  196. J. Schwider, R. Burow:
    The use of rotational-symmetric holograms in optical testing
    Proceedings of ICO 10 Conference in Prague; „Recent advances in optics“; ed. B. Havelka, J. Blabla, , p.471-485 (1975)
  197. Schwider, J. :
    Absolute flatness by means of a combination of a standard with a compensating hologram
    Opt. Commun. (Netherlands) , 6 , p.58 (1972 )
  198. Schwider, J. :
    Interferometrische Homogenitätsprüfung mit Kompensation
    Opt. Commun. (Netherlands) , 6 , p.106 (1972 )
  199. G. Schulz, J. Schwider,C. Hiller, B. Kicker:
    Establishing an optical flatness standard
    Appl. Opt., 10, p.929-934 (1971)
  200. J. Schwider, R. Burow:
    Steigerung der Phasenempfindlichkeit mittels nichtlinearer Prozesse
    Exper. Techn. Phys., 18, p.255 (1970)
  201. J. Schwider, R. Burow:
    Nonlinearities in image holography
    J. Opt. Soc. Am., 60, p.1421 (1970)
  202. Schulz, G.; Schwider, J.; Hiller, Ch.; Kicker, B. :
    Absolute measurements of planarity standards
    Mon.ber. Dtsch. Akad. Wiss. Berl. (East Germany) , 12 , p.763 (1970 )
  203. J. Schwider:
    Informationssteigerung in der Vielstrahlinterferometrie
    Opt. Acta, 15, p.351-372 (1968)
  204. G. Schulz , J. Schwider:
    Precise measurement of planeness
    Appl. Opt., 6, p.1077-1084 (1967)
  205. J. Schwider, Thesis PhD:
    Absolute Ebenheitsprüfung aus interferentiellen Relativmessungen zwischen 3 Planflächennormalen
    Dissertation Humboldt Universität, Dr. rer. nat., , p. (1967)
  206. J. Schwider:
    Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen II
    Opt. Acta , 14, p.389-400 (1967)
  207. J. Schwider, G. Schulz, R. Riekher, G. Minkwitz:
    Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen I
    Opt. Acta, 13, p.103-119 (1966)
  208. J. Schwider:
    Entkopplungsmöglichkeiten von Fabry-Perot Interferometern
    Opt. Acta, 12, p.65-79 (1965)
  209. G. Schulz and J. Schwider:
    Zweistrahlinterferometer, LIchtquellenbild-Transformation als Schraubung und neue Effekte an Interferenzstreifen
    Optik, 22, p.587-597 (1965)