Johannes Schwider
Prof. Dr. Johannes Schwider (retired)
Publikationen:
- Irina Harder, Martin Eisner, Reinhard Völkel, Sergej Rothau, Johannes Schwider, and Peter Schwider :
Measuring the modulus of the spatial coherence function using an error tolerant phase shifting algorithm and a continuous lateral shearing interferometer
Optics Express, doi: 10.1364/OE.24.005087, 24, p. 5087-5101 (2016) - J. Schwider:
Grazing incidence interferometry for rough convex aspherics
arXiv:1612.08046v1 [physics.optics] 23 Dec 2016, , p. (2016) - J. Schwider, V.Nercissian, K. Mantel:
Phase retrieval from carrier frequency interferograms: reduction of the impact of space-variant disturbances
J. Eur. Opt. Soc. Rapid. , 10, p.15003 (2015) - J. Schwider:
Sharp and rectified imaging of plane test objects in diffractive grazing incidence interferometers
Appl. Opt., 53, p.988-1000 (2014) - J. Schwider:
50 years of optics research [Invited]
Appl. Opt., 52, p.9-19 (2013) - K. Mantel, J. Schwider:
Interferometric homogeneity test using adaptive frequency comb illumination
Appl. Opt., 52, p.1897-1912 (2013) - Irina Harder,Gerd Leuchs,Klaus Mantel, and Johannes Schwider:
Adaptive frequency comb illumination for interferometry
APPLIED OPTICS , 50, No. 25 , p.4942-4956 ( 2011) - Vanusch Nercissian, Irina Harder, Klaus Mantel, Andreas Berger, Gerd Leuchs, Norbert Lindlein, and J. Schwider:
Diffractive simultaneous bidirectional shearing interferometry using tailored spatially coherent light
Appl. Opt., 50, p.571-578 (2011) - J. Schwider, G. Leuchs:
Multi-pass Shack-Hartmann planeness test: monitoring thermal stress
Optics Express, Vol. 18 Issue 8, p..8094-8106 (2010) - J. Schwider:
Multiple beam Fizeau interferometer with frequency comb illumination
Opt. Comm., 282, p.3308-3324 (2009) - Gerd Leuchs, Klaus Mantel, Andreas Berger, Hildegard Konermann, Markus Sondermann, Ulf Peschel, Norbert Lindlein, and Johannes Schwider :
Interferometric null test of a deep parabolic reflector generating a Hertzian dipole field
Applied Optics, 47, p.5570-5584 (2008) - R. Schreiner, J. Schwider, N. Lindlein, and K. Mantel :
Absolute testing of the reference surface of a Fizeau interferometer through even/odd decompositions
Applied Optics, 47, p.6134-6141 (2008) - J. Schwider:
Fizeau-type Multi-Pass Shack-Hartmann-Test
Opt. Expr., 16,Issue 1, p.362-372 (2008) - G. Leuchs, N. Lindlein,K. Mantel; M. Sondermann, H. Konermann, J. Schwider:
Interferometric null test of a parabolic reflectorgenerating a Hertzian dipole field
Proc. SPIE, 7063, p. (2008) - J. Schwider:
Coarse frequency comb interferometry
Proc. SPIE, 7063, p.04.1-04.15 (2008) - G.S. Khan, K. Mantel, I. Harder, N. Lindlein, J. Schwider:
Design considerations for the absolute testing approach of aspherics using combined diffractive optical elements.
Appl. Opt., 46(28), p.7040-7048 (2007) - J. Schwider, I. Harder:
A diffractive Polarization-Fizeau-interferometer
EOS Topical Meeting on Diffractive Optics Barcelona, Poster, p. (2007) - J. Schwider, N. Lindlein, K. Mantel, I. Harder:
On the calibration of diffractive nulls for transmission test of aspheric components
Opt. Comm., 279, p.262-272 (2007) - J. Schwider:
Superposition fringes for profiling applications
Proc. SPIE, 6616, p.paper59 (2007) - K. Mantel, J. Lamprecht, N. Lindlein, J. Schwider:
Absolute calibration in grazing incidence interferometry via rotational averaging.
Appl. Opt., 45(16), p.3740-3745 (2006) - K. Mantel, J. Lamprecht, N. Lindlein, J. Schwider:
Calibration for cylindrical specimens in grazing-incidence interferometry via integration of difference measurements.
Appl. Opt., 45(31), p.8013-8018- (2006) - F. Simon, G. Khan, K. Mantel, N. Lindlein, J .Schwider:
Quasi-absolute measurement of aspheres with a combined diffractive optical element as reference.
Appl. Opt., 45(22), p.8606-8612 (2006) - J. Lamprecht, N. Lindlein, J. Schwider:
Characterization of cylindrical micro-lenses in transmitted light and with grazing incidence interferometry in reflected light
Proc. SPIE, 6188, p.Art.No.618816 (2006) - J. Schwider:
Fringe localization in the Twyman-Green Interferometer using extended monochromatic sources”
Proc. SPIE , 6392, p. 0G1-0G12 (2006) - K. Mantel, N. Lindlein, J. Schwider:
Simultaneous characterization of the quality and orientation of cylindrical lens surfaces.
Appl. Opt., 44(15), p.2970-2977 (2005) - K. Mantel, N. Lindlein, J. Schwider:
Simultaneous characterization of the quality and orientation of cylindrical lens surfaces
Appl. Opt.-OT , 44, p.2970-2977 (2005) - J. Schwider:
MOEMS, Micro-Optico-Electro-Mechanical Systems, ed. M. Motamedi
Monography, chapt. Micro-optical Testing, SPIE Press, p.222 (2005) - J. Schwider, G. Fütterer, N. Lindlein:
Diffractive lateral shearing interferometer for phase shift mask measurement using an excimer laser source
Proc. 8-th International Symposium on Laser Metrology Merida Mexico, SPIE, Volume 5776, , p.270-277 (2005) - N. Lindlein, J. Lamprecht, J. Schwider:
Interferometric measurement of microlenses including cylindrical lenses.
In Microoptics, ed. J. Jahns, K.-H. Brenner, Springer, New York, , p. (2004) - J. Schneider, K. Mantel, R. Schreiner, N. Lindlein, J. Schwider:
Compensation of the Anamorphic Distortion in Grazing Incidence Interferometry.
Appl. Opt., 42(22), p.4480 (2003) - Pfortner, A.; Schwider, J. :
Red-green-blue interferometer for the metrology of discontinuous structures
Appl. Opt. (USA) , 42 , p.667-673 (2003 ) - Schreiner, R.; Beyerlein, M.; Harder, I.; Dresel, T.; Lindlein, N.; Schwider, J. :
Form assessment of hollow cylindrical specimens
Appl. Opt. (USA) , 41 , p.64 (2002 ) - Beyerlein, M.; Lindlein, N.; Schwider, J. :
Dual-wave-front computer-generated holograms for quasi-absolute testing of aspherics
Appl. Opt. (USA) , 41 , p.2440 (2002 ) - Ottevaere, H.; Volckaerts, B.; Lamprecht, J.; Schwider, J.; Hermanne, A.; Veretennicoff, I.; Thienpont, H. :
Two-dimensional plastic microlens arrays by deep lithography with protons: Fabrication and characterization
J. Opt. A, Pure Appl. Opt. (UK) , 4 , p.S22 (2002 ) - Schwider, J.; Lindlein, N.; Schreiner, R.; Lamprecht, J. :
Grazing-incidence test for cylindrical microlenses with high numerical aperture
J. Opt. A, Pure Appl. Opt. (UK) , 4 , p.S10 (2002 ) - Schwider, J.; Lamprecht, J. :
Interferometric testing of refractive microcylinder lenses
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4778 , p.177 (2002 ) - Pfortner, A.; Schwider, J. :
3 lambda -metrology
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4777 , p.194-201 (2002 ) - Fuetterer, G.; Lano, M.; Lindlein, N.; Schwider, J. :
Lateral shearing interferometer for phase-shift mask measurement at 193 nm
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4691 , p.541 (2002 ) - Fuetterer, G.; Herbst, W.; Rottstegge, J.; Ferstl, M.; Sebald, M.; Schwider, J. :
Interference patterning of gratings with a period of 150 nm at a wavelength of 157 nm
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4691 , p.1703 (2002 ) - Rottstegge, J.; Herbst, W.; Hien, S.; Fuetterer, G.; Eschbaumer, C.; Hohle, C.; Schwider, J.; Sebald, M. :
Ultrathin film imaging at 157 nm
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4690 , p.233 (2002 ) - Schwider, J.; Lindlein, N.; Schreiner, R.; Lamprecht, J.; Leuchs, G.; Pfund, J.; Beyerlein, M. :
Optical testing of refractive microlenses
Tech. Mess. tm (Germany) , 69 , p.467 (2002 ) - Pfund, J.; Lindlein, N.; Schwider, J. :
Nonnull testing of rotationally symmetric aspheres: a systematic error assessment
Appl. Opt. (USA) , 40 , p.439 (2001 ) - Pfortner, A.; Schwider, J. :
Dispersion error in white-light Linnik interferometers and its implications for evaluation procedures
Appl. Opt. (USA) , 40 , p.6223-6228 (2001 ) - Schwider, J.; Dresel, T.; Beyeriein, M.; Horder, I.; Lindlein, N.; Collischon, M.; Leuchs, G. :
Diffractive optical elements for light manipulation
LaserOpto (Germany) , 33 , p.41 (2001 ) - Lindlein, N.; Pfund, J.; Schwider, J. :
Algorithm for expanding the dynamic range of a Shack-Hartmann sensor by using a spatial light modulator array
Opt. Eng., Bellingham (USA) , 40 , p.837 (2001 ) - Kipfer, P.; Collischon, M.; Haidner, H.; Schafer, H.; Schwider, J. :
A novel design for beam forming grating couplers
Optik (Germany) , 112 , p.76 (2001 ) - Dresel, T.; Lindlein, N.; Schwider, J. :
Empirical strategy for detection and removal of misalignment aberrations in interferometry
Optik (Germany) , 112 , p.304 (2001 ) - Lindlein, N.; Schwider, J. :
Optical measurement methods for refractive microlenses and arrays
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4455 , p.264 (2001 ) - Ottevaere, H.; Tuteleers, P.; Volchaerts, B.; Baukens, V.; Lamprecht, J.; Schwider, J.; Hermanne, A.; Naessens, K.; Veretennicoff, I.; Thienpont, H. :
Microlens arrays fabricated by deep lithography with protons and their characterization
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4455 , p.272 (2001 ) - Lindlein, N.; Lamprecht, J.; Mantel, K.; Schwider, J. :
Interferometrical measurement of cylindrical lenses with the help of computer generated holograms
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 4440 , p.127 (2001 ) - Groening, S.; Sick, B.; Donner, K.; Pfund, J.; Lindlein, N.; Schwider, J. :
Wave-front reconstruction with a Shack-Hartmann sensor with an iterative spline fitting method
Appl. Opt. (USA) , 39 , p.561 (2000 ) - Pfund, J.; Schwider, J. :
Laser beam characterization by using a Shack-Hartmann sensor
Conference Digest. 2000 Conference on Lasers and Electro-Optics Europe (Cat. No.00TH8505) , , p. (2000 ) - Breitkopf, P.; Collischon, M.; Schmidt, J.; Schwider, J. :
Holographically recorded axicon for grazing incidence interferometry
J. Mod. Opt. (UK) , 47 , p.701 (2000 ) - Hettwer, A.; Kranz, J.; Schwider, J. :
Three channel phase-shifting interferometer using polarization-optics and a diffraction grating
Opt. Eng., Bellingham (USA) , 39 , p.960 (2000 ) - Lindlein, N.; Pfund, J.; Schwider, J. :
Expansion of the dynamic range of a Shack-Hartmann sensor by using astigmatic microlenses
Opt. Eng., Bellingham (USA) , 39 , p.2220 (2000 ) - Nurge, H.; Schwider, J. :
Measurement of curvature and thickness variations of plane surfaces by grazing incidence interferometry
Optik (Germany) , 111 , p.319 -327 (2000 ) - Schreiner, R.; Lindlein, N.; Dresel, T.; Schwider, J.; Brinkmann, S.; Mischo, H. :
Testing acylindrical microlenses at grazing incidence
Optik (Germany) , 111 , p.397 -406 (2000 ) - Nurge, H.; Schwider, J. :
Testing of cylindrical lenses by grazing incidence interferometry
Optik (Germany) , 111 , p.545 -555 (2000 ) - Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
Grazing incidence interferometry using diffractive optical elements for the shape measurement of the mantle surface of rod-shaped objects. I. Measuring principle and theory
Tech. Mess. tm (Germany) , 67 , p.10 -19 (2000 ) - Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
Grazing incidence interferometry using diffractive optical elements for the shape measurement of the mantle surface of rod-shaped objects. II. Experiments and error assessment
Tech. Mess. tm (Germany) , 67 , p.81-91 (2000 ) - Beyerlein, M.; Schwider, J. :
Comparing beam-shaping CGHs for coherent and partially coherent light
Trends in Optics and Photonics. Diffractive Optics and Micro-Optics. Vol.41. Technical Digest. Postconference Edition , , p.29 (2000 ) - Pfund, J.; Lindlein, N.; Schwider, J. :
Non-null testing of aspherical surfaces by using a Shack-Hartmann sensor
Trends in Optics and Photonics. Optical Fabrication and Testing. Vol.42. Technical Digest. Postconference Edition , , p.112 (2000 ) - Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
Testing of rod objects by grazing-incidence interferometry: experiment
Appl. Opt. (USA) , 38 , p.121 -125 (1999 ) - Schwider, J.; Dresel, T.; Manzke, B. :
Some considerations of reduction of reference phase error in phase-stepping interferometry
Appl. Opt. (USA) , 38 , p.655 (1999 ) - Emer, W.; Schwider, J. :
Ultraviolet interferometry with apochromatic reflection optics
Appl. Opt. (USA) , 38 , p.3516 (1999 ) - S. Brinkmann, Th. Dresel, R. Schreiner, J. Schwider:
*Das Diffraxicon-Interferometer zur Prüfung von Zylinderflächen*
Laser, 3, p.28-31 (1999) - J. Schwider:
Interferometric tests for aspherics”, in
OSA TOPS Vol. 24 Fabrication and Testing of Aspheres; eds. J. S. Taylor, M. Piscotty, and A. Lindquist, 24, p.103-114 (1999) - Sickinger, H.; Schwider, J.; Manzke, B. :
Fiber based Mach-Zehnder interferometer for measuring wave aberrations of microlenses
Optik (Germany) , 110 , p.239 (1999 ) - Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
Interferometric testing of technical surfaces by grazing incidence interferometry in the infrared region
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3823 , p.115 -122 (1999 ) - Kranz, J.; Hettwer, A.; Lamprecht, J.; Schwider, J. :
Error analysis for a single-frame phase-shifting speckle interferometer
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.178 (1999 ) - Pfund, J.; Lindlein, N.; Schwider, J. :
Aspherical surface testing by using spherical compensation
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.254 (1999 ) - Schwider, J.; Brinkmann, S.; Schreiner, R.; Dresel, T. :
Grazing incidence interferometry with the help of diffractive masters
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.290 (1999 ) - Nurge, H.; Schwider, J. :
Testing of cylindrical lenses by grazing incidence interferometry
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3749 , p.609 (1999 ) - Sharma, D.K.; Schwider, J. :
Twyman Green interferometer with CGH for testing of cylindrical surfaces
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3729 , p.399 (1999 ) - Wachter, C.; Schreiber, P.; Karthe, W.; Elbers, J.-P.; Glingener, C.; Voges, E.; Krabe, R.; Dumcke, R.; Reichl, H.; Hagner, G.; Schroter, S.; Bartelt, H.; Stock, E.A.; Bauer, G.; Schafer, W.; Sickinger, H.; Schwider, J. :
Design and modelling of optical microsystems-an approach to a user-friendly system integration technique
1998 International Conference on Modeling and Simulation of Microsystems, Semiconductors, Sensors and Actuators , , p.631 (1998 ) - Pfund, J.; Lindlein, N.; Schwider, J. :
Misalignment effects of the Shack-Hartmann sensor
Appl. Opt. (USA) , 37 , p.22 (1998 ) - Hocke, R.; Brand, H.; Collischon, M.; Schwider, J. :
Line-selective CO/sub 2/ lasers with apodized Littrow-gratings
ITG-Fachber. (Germany) , , p.393 (1998 ) - Dresel, T.; Brinkmann, S.; Schreiner, R.; Schwider, T. :
Testing of rod objects by grazing incidence interferometry: theory
J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 15 , p.2921 -2928 (1998 ) - Lindlein, N.; Simon, F.; Schwider, J. :
Simulation of micro-optical array systems with RAYTRACE
Opt. Eng., Bellingham (USA) , 37 , p.1809 (1998 ) - Brinkmann, S.; Schreiner, R.; Dresel, T.; Schwider, J. :
Interferometric testing of plane and cylindrical workpieces with computer-generated holograms
Opt. Eng., Bellingham (USA) , 37 , p.2506 -2511 (1998 ) - Pfund, J.; Lindlein, N.; Schwider, J.; Burow, R.; Blumel, Th.; Elssner, K.-E. :
Absolute sphericity measurement: a comparative study of the use of interferometry and a Shack-Hartmann sensor
Opt. Lett. (USA) , 23 , p.742 (1998 ) - Eisner, M.; Lindlein, N.; Schwider, J. :
Confocal microscopy with a refractive microlens-pinhole array
Opt. Lett. (USA) , 23 , p.748 (1998 ) - Pfund, J.; Lindlein, N.; Schwider, J. :
Dynamic range expansion of a Shack-Hartmann sensor by use of a modified unwrapping algorithm
Opt. Lett. (USA) , 23 , p.995 (1998 ) - Schwider, J. :
DOE-based interferometry
Optik (Germany) , 108 , p.181 (1998 ) - Emer, W.; Schwider, J. :
Interferometry with VUV wavelengths
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3478 , p.202 (1998 ) - Lindlein, N.; Schwider, J. :
Measurement devices with and for micro-optics at the University of Erlangen
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3407 , p.47 (1998 ) - Kranz, J.; Lamprecht, J.; Hettwer, A.; Schwider, J. :
Fiber optical single frame speckle interferometer for measuring industrial surfaces
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3407 , p.328 (1998 ) - Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
Optical testing of cylindrical surfaces by grazing incidence interferometry in the infrared region
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3407 , p.443 (1998 ) - Schwider, J. :
White-light Fizeau interferometer
Appl. Opt. (USA) , 36 , p.1433 (1997 ) - Lindlein, N.; Schreiner, R.; Brinkmann, S.; Dresel, T.; Schwider, J. :
Axicon-type test interferometer for cylindrical surfaces: systematic error assessment
Appl. Opt. (USA) , 36 , p.2791-2795 (1997 ) - Schreiber, H.; Schwider, J. :
Lateral shearing interferometer based on two Ronchi phase gratings in series
Appl. Opt. (USA) , 36 , p.5321 (1997 ) - Gundlach, A.; Huntley, J.M.; Manzke, B.; Schwider, J. :
Speckle shearing interferometry using a diffractive optical beamsplitter
Opt. Eng., Bellingham (USA) , 36 , p.1488 (1997 ) - Schwider, J.; Sickinger, H. :
Array tests for microlenses
Optik (Germany) , 107 , p.26 (1997 ) - Brinkmann, S.; Schreiner, R.; Dresel, T.; Schwider, J. :
Interferometric testing of technical surfaces with computer generated holograms
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 3098 , p.83 (1997 ) - Dresel, T.; Beyerlein, M.; Schwider, J. :
Design and fabrication of computer-generated beam-shaping holograms
Appl. Opt. (USA) , 35 , p.4615 (1996 ) - Dresel, T.; Beyerlein, M.; Schwider, J. :
Design of computer generated beam-shaping holograms by iterative finite-element mesh adaption
Appl. Opt. (USA) , 35 , p.6865 (1996 ) - Dresel, T.; Schwider, J. :
Fabrication of optical components by laser lithography
Appl. Surf. Sci. (Netherlands) , 106 , p.379 (1996 ) - Kipfer, P.; Collischon, M.; Haidner, H.; Schwider, J. :
Subwavelength structures and their use in diffractive optics
Opt. Eng., Bellingham (USA) , 35 , p.726 (1996 ) - Schwider, J. :
Achromatic design of holographic optical interconnects
Opt. Eng., Bellingham (USA) , 35 , p.826 (1996 ) - Falkenstorfer, O.; Lindlein, N.; Keinonen, T.; Schwider, J. :
Diffraction-limited holographic lenses in dichromated gelatine
Opt. Eng., Bellingham (USA) , 35 , p.2026 (1996 ) - Eisner, M.; Schwider, J. :
Transferring resist microlenses into silicon by reactive ion etching
Opt. Eng., Bellingham (USA) , 35 , p.2979 (1996 ) - Heissmeier, M.; Sheridan, J.T.; Schwider, J. :
Calibration of a microlithographic fabrication process using non-destructive testing and rigorous electromagnetic theory
Optik (Germany) , 103 , p.12 (1996 ) - Brinkmann, S.; Dresel, T.; Schreiner, R.; Schwider, J. :
Axicon-type test interferometer for cylindrical surfaces
Optik (Germany) , 102 , p.106-110 (1996 ) - Du, C.; Zuerl, K.; Schwider, J. :
Wavefront characterization with a miniaturized Shack-Hartmann sensor
Optik (Germany) , 101 , p.151 (1996 ) - Schwider, J.; Schreiber, H.; Zhou, L. :
Physical limitations and challenges in modern interferometry
Optik (Germany) , 101 , p.166 (1996 ) - J. Schwider, O. Falkenstörfer:
Twyman-Green interferometer for testing microspheres”,
Opt. Eng. , 34, p.2972-2975 (1995) - Kobolla, H.; Schmidt, J.; Gluch, E.; Schwider, J. :
Holographic perfect shuffle permutation element for a miniaturized switching network
Appl. Opt. (USA) , 34 , p.2844 (1995 ) - Volkel, R.; Junger, S.; Rosner, S.; Schwider, J.; Gruhler, U.; Schreck, H.; Burghardt, H.; Wiedeburg, K. :
Optical backplane for a broadband switching system
Electron. Lett. (UK) , 31 , p.234 (1995 ) - Collischon, M.; Haidner, H.; Kipfer, P.; Schwab, M.; Schwider, J. :
Optimized artificial index gratings
Infrared Phys. Technol. (UK) , 36 , p.915 (1995 ) - Korner, T.O.; Sheridan, J.T.; Schwider, J. :
Interferometric resolution examined by means of electromagnetic theory
J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 12 , p.752 (1995 ) - Schwab, M.; Lindlein, N.; Schwider, J.; Amitai, Y.; Friesem, A.A.; Reinhorn, S. :
Compensation of the wavelength dependence in diffractive star couplers
J. Opt. Soc. Am. A, Opt. Image Sci. Vis. (USA) , 12 , p.1290 (1995 ) - Schwider, J.; Falkenstorfer, O. :
Twyman-Green interferometer for testing microspheres
Opt. Eng., Bellingham (USA) , 34 , p.2972 -2975 (1995 ) - Dresel, T.; Schwider, J.; Wehrhahn, A.; Babin, S. :
Grazing incidence interferometry applied to the measurement of cylindrical surfaces
Opt. Eng., Bellingham (USA) , 34 , p.3531-3535 (1995 ) - Zurl, K.; Gluch, E.; Schafer, B.; Schwider, J.; Fey, D.; Erhard, W. :
Smart pixels with VCSELs: potential and demonstration system
Optical Computing. Proceedings of the International Conference , , p.507 (1995 ) - Koerner, T.O.; Sheridan, J.T.; Schwider, J. :
Classical diffraction by deep rectangular gratings using the Legendre exact eigenfunction method
Optik (Germany) , 99 , p.95 (1995 ) - Kranz, J.; Mejri, J.; Zurl, K.; Schwider, J. :
A monolithic optoelectronic high-speed receiver circuit
Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2A , , p.226 (1995 ) - Eisner, M.; Falkenstorfer, O.; Haselbeck, S.; Schwider, J. :
Etched microlenses in silicon
Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2A , , p.377 (1995 ) - Dresel, Th.; Beyerlein, M.; Schwider, J. :
Computer generated beam shaping holograms
Photonics `95. European Optical Society Annual Meetings Digest Series: Vol.2B , , p.584 (1995 ) - Schwider, J. :
Achromatic design of holographic optical interconnects
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2537 , p.148 (1995 ) - Schwider, J.; Zhou, L. :
Dispersive interferometric profilometer
Proceedings of the International Seminar on Quantitative Microscopy. 125th PTB-Seminar (PTB-Bericht F-21) , , p.1 (1995 ) - Collischon, M.; Haidner, I.; Kipfer, P.; Lang, A.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J. :
Binary blazed reflection gratings
Appl. Opt. (USA) , 33 , p.3572 (1994 ) - Hutfless, J.; Rebhan, T.; Lutz, N.; Geiger, M.; Frank, M.; Streibl, N.; Schwider, J. :
Micro optics for efficient material processing with excimer lasers
Laser Optoelektron. (Germany) , 26 , p.50 (1994 ) - Kipfer, P.; Collischon, M.; Haidner, H.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J. :
Infrared optical components based on a microrelief structure
Opt. Eng., Bellingham (USA) , 33 , p.79 (1994 ) - Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Schwider, J. :
Characterization of microlenses using a phase-shifting shearing interferometer
Opt. Eng., Bellingham (USA) , 33 , p.2680 (1994 ) - Schwider, T.; Streibl, N.; Schmidt, J.; Zurl, K.; Volkel, R. :
Synchronous optical clock distribution for optoelectronic interconnections
Opt. Lett. (USA) , 19 , p.75 (1994 ) - Schwider, J. :
Detection of undersampling from measured phase-shifting data
Opt. Lett. (USA) , 19 , p.231 (1994 ) - Schwider, J.; Liang Zhou :
Dispersive interferometric profilometer
Opt. Lett. (USA) , 19 , p.995 (1994 ) - Sheridan, J.T.; Schwider, J.; Streibl, N.; Haselbeck, S.; Eisner, M.; Heissmeier, H.; Falkenstorfer, O. :
Modelling and measurement of melted microlens shapes
Optik (Germany) , 97 , p.174 (1994 ) - Heissmeier, M.; Sheridan, J.T.; Schwider, J.; Streibl, N. :
Detection of errors in microlithographic grating fabrication using a simple methodology
Optik (Germany) , 95 , p.161 (1994 ) - Kipfer, P.; Collischon, M.; Haidner, H.; Schwider, J. :
Diffractive surface relief elements for the use in the infrared: waveguide structures as reflection holograms
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2169 , p.100 (1994 ) - Haselbeck, S.; Eisner, M.; Schreiber, H.; Schwider, J. :
Reactive ion etching of microlens arrays into fused silica
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2169 , p.142 (1994 ) - Falkenstorfer, O.; Keinonen, T.; Lindlein, N.; Schwider, J.; Streibl, N. :
Iterative correction of holographic lenses
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2169 , p.200 (1994 ) - Schwab, M.; Lindlein, N.; Schwider, J.; Amitai, Y.; Friesem, A.A.; Reinhorn, S. :
Achromatic diffractive fan-out systems
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 2152 , p.173 (1994 ) - Volkel, R.; Junger, S.; Kobolla, H.; Schmidt, J.; Schwider, J.; Streibl, N. :
Optoelectronic interconnects with high packing densities
Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.10 (1993 ) - Schwider, J.; Haselbeck, S.; Schreiber, H.; Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Keinonen, T.; Sheridan, S.; Streibl, N. :
Production and control of refractive and diffractive microlenses
Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.47 (1993 ) - Collischon, M.; Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J. :
Design of artificial dielectric diffractive elements
Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.204 (1993 ) - Collischon, M.; Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J. :
Diffractive optical elements for high power CO/sub 2/ laser applications
Fourth International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.379) , , p.243 (1993 ) - Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Collischon, M.; Hutfless, J.; Marz, M. :
Diffraction grating with rectangular grooves exceeding 80% diffraction efficiency
Infrared Phys. (UK) , 34 , p.467 (1993 ) - Kobolla, H.; Sheridan, J.T.; Gluch, E.; Schmidt, J.; Volkel, R.; Schwider, J.; Streibl, N. :
Holographic 2D mixed polarization deflection elements
J. Mod. Opt. (UK) , 40 , p.613 (1993 ) - Lindlein, N.; Schwider, J.; Schrader, M.; Falkenstorfer, O.; Volkel, R.; Streibl, N. :
Wavelength mismatch correcting elements for volume holograms written on a laser pattern generator
J. Mod. Opt. (UK) , 40 , p.647 (1993 ) - Falkenstorfer, O.; Schwider, J.; Lindlein, N.; Bohm, A.; Schreiber, H.; Otto, A.; Volkel, R.; Zoller, A. :
Interferometric measurement of holographic lenslets
J. Mod. Opt. (UK) , 40 , p.733 (1993 ) - Volkel, R.; Rosner, S.; Kobolla, H.; Schmidt, J.; Schwider, J.; Sheridan, J.T.; Streibl, N. :
Measurements of the angular spectrum of stray-light for holographic optical elements in dichromated gelatin
J. Mod. Opt. (UK) , 40 , p.1787 (1993 ) - Gluch, E.; Kobolla, H.; Zurl, K.; Streibl, N.; Schwider, J. :
Demonstration for an optoelectronic switching network
J. Mod. Opt. (UK) , 40 , p.1857 (1993 ) - Lindlein, N.; Schwider, J. :
Local wave fronts at diffractive elements
J. Opt. Soc. Am. A, Opt. Image Sci. (USA) , 10 , p.2563 (1993 ) - Streibl, N.; Volkel, R.; Schwider, J.; Habel, P.; Lindlein, N. :
Parallel optoelectronic interconnections with high packing density through a light-guiding plate using grating couplers and field lenses
Opt. Commun. (Netherlands) , 99 , p.167 (1993 ) - Haidner, H.; Sheridan, J.T.; Schwider, J.; Streibl, N. :
Design of a blazed grating consisting of metallic subwavelength binary grooves
Opt. Commun. (Netherlands) , 98 , p.5 (1993 ) - Krackhardt, U.; Schwider, J.; Schrader, M.; Streibl, N. :
Synthetic holograms written by a laser pattern generator
Opt. Eng., Bellingham (USA) , 32 , p.781 (1993 ) - Haselbeck, S.; Schreiber, H.; Schwider, J.; Streibl, N. :
Microlenses fabricated by melting a photoresist on a base layer
Opt. Eng., Bellingham (USA) , 32 , p.1322 (1993 ) - Haidner, H.; Kipfer, P.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Lindolf, J.; Collischon, M.; Lang, A.; Hutfless, J. :
Polarizing reflection grating beamsplitter for the 10.6- mu m wavelength
Opt. Eng., Bellingham (USA) , 32 , p.1860 (1993 ) - Schwider, J.; Falkenstorfer, O.; Schreiber, H.; Zoller, A.; Streibl, N. :
New compensating four-phase algorithm for phase-shift interferometry
Opt. Eng., Bellingham (USA) , 32 , p.1883 -1885 (1993 ) - Schwider, J.; Streibl, N.; Zurl, K. :
Optoelectronic interconnections
Parallel Computer Architectures Theory, Hardware, Software, Applications , , p.1 (1993 ) - Schwider, J.; Haselbeck, S.; Schreiber, H.; Sickinger, H.; Falkenstorfer, O.; Lindlein, N.; Zoller, A.; Haidner, H.; Kipfer, P.; Heissmeier, M.; Keinonen, T.; Sheridan, J.T.; Brinkmann, S.; Streibl, N. :
Production and control of refractive and diffractive microlenses
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1992 , p.102 (1993 ) - Volkel, R.; Heibmeier, M.; Kobolla, H.; Krackhardt, U.; Rosner, S.; Schmidt, J.; Schwider, J.; Sheridan, J.T.; Streibl, N.; Zobel, F. :
Optoelectronic interconnects with holographic optical elements
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1849 , p.104 (1993 ) - Schmidt, J.; Volkel, R.; Rosner, S.; Stork, W.; Sheridan, J.T.; Durst, F.; Schwider, J.; Streibl, N. :
Holographic optical coupling and beamsplitting elements for optoelectronic interconnects and sensors
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1751 , p.268 (1993 ) - Streibl, N.; Heissmeier, M.; Hofmann, W.; Krackhardt, U.; Schrader, M.; Schwider, J.; Sperl, M. :
Laser beam writing of computer generated diffractive optical components
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.67 (1993 ) - Falkenstorfer, O.; Schwider, J.; Bohm, A.; Schreiber, H. :
Measurement of the wave aberrations of holographic optical lens elements
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.112 (1993 ) - Schmidt, J.; Volkel, R.; Schwider, J.; Sheridan, J.T.; Stork, W.; Streibl, N.; Stieglmeier, M.; Durst, F. :
Holographic optical elements for interconnects and sensors
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.271 (1993 ) - Kobolla, H.; Sheridan, J.T.; Gluch, E.; Schwider, J.; Streibl, N. :
Mixed polarization 2-D holographic permutation elements
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1732 , p.278 (1993 ) - Lindlein, N.; Schwider, J.; Habel, P.; Schrader, M. :
Computer generated holograms for the correction of the aberrations of thick holographic optical lens elements
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1718 , p.13 (1993 ) - Falkenstorfer, O.; Schwider, J.; Bohm, A.; Schreiber, H. :
Measurement of the wave aberrations of holographic optical lens elements
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1718 , p.22 (1993 ) - Haselbeck, S.; Heissmeier, M.; Hofmann, W.; Krackhardt, U.; Manzke, B.; Savander, P.; Schrader, M.; Schwider, J.; Sperl, M.; Streibl, N. :
Synthetic phase holograms written by laser lithography
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1718 , p.117 (1993 ) - Schwider, J. :
Measuring phase dispersion of dielectric multilayer stacks
Appl. Opt. (USA) , 31 , p.6107 (1992 ) - Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
Possibilities and limitations of space-variant holographic optical elements for switching networks and general interconnects
Appl. Opt. (USA) , 31 , p.7403 (1992 ) - Schmidt, J.; Volkel, R.; Stork, W.; Sheridan, J.T.; Schwider, J.; Streibl, N.; Durst, F. :
Diffractive beam splitter for laser Doppler velocimetry
Opt. Lett. (USA) , 17 , p.1240 (1992 ) - Schwider, J. :
Fizeau- and Michelson-type interferograms and their relation to the absolute testing of optical surfaces
Optik (Germany) , 89 , p.113 (1992 ) - Lindlein, N.; Schwider, J. :
Practical notes on designing and analysing thick holographic optical elements
Pure Appl. Opt. (UK) , 1 , p.111 (1992 ) - Dresel, T.; Horstmann, A.; Otto, A.; Schwider, J. :
UV interferometry for microstructure measurements
Pure Appl. Opt. (UK) , 1 , p.241 (1992 ) - J. Schwider:
Characterisation of interconnection components
Lalanne, P. Chavel, Perspectives for parallel optical interconnects, Springer, p.109-148 (1991) - Haumann, H.J.; Kobolla, H.; Sauer, F.; Schmidt, J.; Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
Optoelectronic interconnection based on a light-guiding plate with holographic coupling elements
Opt. Eng., Bellingham (USA) , 30 , p.1620 (1991 ) - Kobolla, H.; Lindlein, N.; Falkenstorfer, O.; Rosner, S.; Schmidt, J.; Schwider, J.; Streibl, N.; Volkel, R. :
Optoelectronic interconnects with holographic optical elements
Third International Conference on Holographic Systems, Components and Applications (Conf. Publ. No.342) , , p.123 (1991 ) - Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
Possibilities and limitations of space-variant holographic optical elements for switching networks and general interconnects
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1319 , p.130 (1990 ) - Haumann, H.-J.; Kobolla, H.; Sauer, F.; Schwider, J.; Stork, W.; Streibl, N.; Volkel, R. :
Holographic coupling elements for optical bus systems based on a light-guiding optical backplane
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 1319 , p.588 (1990 ) - J. Schwider:
Advanced evaluation techniques in interferometry
Prog. in Optics XXVIII, E. Wolf, Ed., Elsivier Publisher New York , 28, p.271-359 (1990) - Schwider, J. :
Phase shifting interferometry: reference phase error reduction
Appl. Opt. (USA) , 28 , p.3889 (1989 ) - Lohmann, A.W.; Lukosz, W.; Schwider, J.; Streibl, N.; Thomas, J.A. :
Array illuminators for the optical computer
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 963 , p.232 (1989 ) - Lohmann, A.W.; Schwider, J.; Streibl, N.; Thomas, J. :
Array illuminator based on phase contrast
Appl. Opt. (USA) , 27 , p.2915 (1988 ) - Kinnstaetter, K.; Lohmann, A.W.; Schwider, J.; Streibl, N. :
Accuracy of phase shifting interferometry
Appl. Opt. (USA) , 27 , p.5082 -5089 (1988 ) - Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
Semiconductor wafer and technical flat planeness testing interferometer
Measurement (UK) , 5 , p.98 (1987 ) - Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
Semiconductor wafer and technical flat planeness testing interferometer
Appl. Opt. (USA) , 25 , p.1117 (1986 ) - Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. : :
Semiconductor wafer and technical flat planeness testing interferometer
Proceedings of 1st Symposium of the technical committee TC14 IMEKO , Working Group on Laser Measurement, Budapest 11.19-21, 1986, Nova Science Publishers, Commmack, New York,11725, , p.85-92 (1986) - Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. : :
Results and error sources in absolute sphericity measurement
Proceedings of 1st Symposium of the technical committee TC14 IMEKO , Working Group on Laser Measurement, Budapest 11.19-21, 1986, Nova Science Publishers, Commmack, New York,11725, , p.93-103 (1986) - Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. : :
Automatic frozen fringe analysis
Proceedings of 1st Symposium of the technical committee TC14 IMEKO , Working Group on Laser Measurement, Budapest 11.19-21, 1986, Nova Science Publishers, Commmack, New York,11725, , p.227-235 (1986) - Schwider, J.; Burow, R.; Elssner, K.-E.; Spolaczyk, R.; Grzanna, J. :
Homogeneity testing by phase sampling interferometry
Appl. Opt. (USA) , 24 , p.3059 (1985 ) - Schwider, J. :
Continuous lateral shearing interferometer
Appl. Opt. (USA) , 23 , p.4403 (1984 ) - Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R. :
High accuracy phase measurement in real time
Proc. SPIE – Int. Soc. Opt. Eng. (USA) , 473 , p.156 (1984 ) - Schwider, J.; Burow, R.; Elssner, K.-E.; Grzanna, J.; Spolaczyk, R.; Merkel, K. :
Digital wave-front measuring interferometry: some systematic error sources
Appl. Opt. (USA) , 22 , p.3421-3432 (1983 ) - Schwider, J. :
Single sideband Ronchi test
Appl. Opt. (USA) , 20 , p.2635 (1981 ) - Schwider, J. :
Superposition fringe shear interferometer
Appl. Opt. (USA) , 19 , p.4233 (1980 ) - Schwider, J.; Grzanna, J.; Spolaczyk, R.; Burow, R. :
Testing aspherics in reflected light using blazed synthetic holograms
Opt. Acta (UK) , 27 , p.683 (1980 ) - Schwider, J. :
Superposition fringes as a measuring tool in optical testing
Appl. Opt. (USA) , 18 , p.2364 -2367 (1979 ) - Schwider, J.; Burow, R. :
Wave aberrations caused by misalignments of aspherics, and their elimination
Opt. Appl. (Poland) , 9 , p.33 (1979 ) - Schwider, J.; Burow, R.; Grzanna, J. :
CGH-testing of rotational-symmetric aspheric in compensated interferometers
Opt. Appl. (Poland) , 9 , p.39 (1979 ) - Schwider, J.; Hiller, Ch. :
The alignment of flat structures by means of Moire technique
Opt. Acta (UK) , 23 , p.49 (1976 ) - Schwider, J. :
Interferometric measurement of the amplitude point spread function and the wavefront variation
Opt. Acta (UK) , 23 , p.115 -127 (1976 ) - Schulz, G.; Schwider, J. :
Interferometric testing of smooth surfaces
Progress in optics, vol.XIII , , p.93 (1976 ) - J. Schwider, R. Burow:
The use of rotational-symmetric holograms in optical testing
Proceedings of ICO 10 Conference in Prague; „Recent advances in optics“; ed. B. Havelka, J. Blabla, , p.471-485 (1975) - Schwider, J. :
Absolute flatness by means of a combination of a standard with a compensating hologram
Opt. Commun. (Netherlands) , 6 , p.58 (1972 ) - Schwider, J. :
Interferometrische Homogenitätsprüfung mit Kompensation
Opt. Commun. (Netherlands) , 6 , p.106 (1972 ) - G. Schulz, J. Schwider,C. Hiller, B. Kicker:
Establishing an optical flatness standard
Appl. Opt., 10, p.929-934 (1971) - J. Schwider, R. Burow:
Steigerung der Phasenempfindlichkeit mittels nichtlinearer Prozesse
Exper. Techn. Phys., 18, p.255 (1970) - J. Schwider, R. Burow:
Nonlinearities in image holography
J. Opt. Soc. Am., 60, p.1421 (1970) - Schulz, G.; Schwider, J.; Hiller, Ch.; Kicker, B. :
Absolute measurements of planarity standards
Mon.ber. Dtsch. Akad. Wiss. Berl. (East Germany) , 12 , p.763 (1970 ) - J. Schwider:
Informationssteigerung in der Vielstrahlinterferometrie
Opt. Acta, 15, p.351-372 (1968) - G. Schulz , J. Schwider:
Precise measurement of planeness
Appl. Opt., 6, p.1077-1084 (1967) - J. Schwider, Thesis PhD:
Absolute Ebenheitsprüfung aus interferentiellen Relativmessungen zwischen 3 Planflächennormalen
Dissertation Humboldt Universität, Dr. rer. nat., , p. (1967) - J. Schwider:
Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen II
Opt. Acta , 14, p.389-400 (1967) - J. Schwider, G. Schulz, R. Riekher, G. Minkwitz:
Ein Interferenzverfahren zur Absolutprüfung von Planflächennormalen I
Opt. Acta, 13, p.103-119 (1966) - J. Schwider:
Entkopplungsmöglichkeiten von Fabry-Perot Interferometern
Opt. Acta, 12, p.65-79 (1965) - G. Schulz and J. Schwider:
Zweistrahlinterferometer, LIchtquellenbild-Transformation als Schraubung und neue Effekte an Interferenzstreifen
Optik, 22, p.587-597 (1965)